RF Durable Low Insertion Loss Wafer Test Probes

1. RF circuit test:
RF probes can be connected to the test point of the RF circuit, by measuring the amplitude, phase, frequency and other parameters of the signal to evaluate the performance and stability of the circuit. It can be used to test RF power amplifier, filter, mixer, amplifier and other RF circuits.
2. Wireless communication system test:
RF probe can be used to test wireless communication devices, such as mobile phones, Wi-Fi routers, Bluetooth devices, etc. By connecting the RF probe to the antenna port of the device, parameters such as transmit power, receive sensitivity, and frequency deviation can be measured to evaluate the performance of the device and guide system debugging and optimization.
3. RF antenna test:
RF probe can be used to measure the radiation characteristics of the antenna and input impedance. By touching the RF probe to the antenna structure, the antenna's VSWR (voltage standing wave ratio), radiation mode, gain and other parameters can be measured to evaluate the performance of the antenna and carry out antenna design and optimization.
4. RF signal monitoring:
RF probe can be used to monitor the transmission of RF signals in the system. It can be used to detect signal attenuation, interference, reflection and other problems, help find and diagnose faults in the system, and guide the corresponding maintenance and debugging work.
5. Electromagnetic compatibility (EMC) test:
RF probes can be used to perform EMC tests to assess the sensitivity of electronic devices to RF interference in the surrounding environment. By placing an RF probe near the device, it is possible to measure the device's response to external RF fields and evaluate its EMC performance.